JPH0391984U - - Google Patents

Info

Publication number
JPH0391984U
JPH0391984U JP43990U JP43990U JPH0391984U JP H0391984 U JPH0391984 U JP H0391984U JP 43990 U JP43990 U JP 43990U JP 43990 U JP43990 U JP 43990U JP H0391984 U JPH0391984 U JP H0391984U
Authority
JP
Japan
Prior art keywords
switch
terminal
test module
test
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP43990U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP43990U priority Critical patent/JPH0391984U/ja
Publication of JPH0391984U publication Critical patent/JPH0391984U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP43990U 1990-01-08 1990-01-08 Pending JPH0391984U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP43990U JPH0391984U (en]) 1990-01-08 1990-01-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP43990U JPH0391984U (en]) 1990-01-08 1990-01-08

Publications (1)

Publication Number Publication Date
JPH0391984U true JPH0391984U (en]) 1991-09-19

Family

ID=31504387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP43990U Pending JPH0391984U (en]) 1990-01-08 1990-01-08

Country Status (1)

Country Link
JP (1) JPH0391984U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350508A (ja) * 2001-05-30 2002-12-04 Advantest Corp 半導体デバイス試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350508A (ja) * 2001-05-30 2002-12-04 Advantest Corp 半導体デバイス試験装置

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